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Delay fault coverage, test set size, and performance trade-offs.

William K. C. LamAlexander SaldanhaRobert K. BraytonAlberto L. Sangiovanni-Vincentelli
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1995)
Keyphrases
  • test set
  • trade off
  • error rate
  • training set
  • training data
  • evaluation methodology
  • test data
  • test cases
  • class distribution
  • random selection
  • data mining
  • active learning
  • input image
  • training and test sets