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Layout-Aware Fast Bridge/Open Test Generation by 2-Step Pattern Reordering.
Masayuki Arai
Shingo Inuyama
Kazuhiko Iwasaki
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2018)
Keyphrases
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test generation
test cases
symbolic execution
test sequences
pattern matching
design automation
static analysis
software testing
mutation testing
quality assurance
decision making
real world
code coverage
database
case study
databases
data sets