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Towards approximation during test of Integrated Circuits.

Imran WaliMarcello TraiolaArnaud VirazelPatrick GirardMario BarbareschiAlberto Bosio
Published in: DDECS (2017)
Keyphrases
  • integrated circuit
  • built in self test
  • electron beam
  • error bounds
  • test cases
  • efficient computation
  • data mining
  • decision trees
  • software testing
  • queueing networks
  • approximation schemes