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Built-In Test and Diagnosis for TSVs With Different Placement Topologies and Crosstalk Impact Ranges.

Wen-Hsuan HsuMichael Andreas KochteKuen-Jong Lee
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2017)
Keyphrases
  • diagnostic tests
  • fault diagnosis
  • high impact
  • information retrieval
  • hidden markov models
  • model based diagnosis
  • multiple faults
  • real time
  • fault detection
  • software testing
  • network topologies
  • skin lesion