Trimming Feature Extraction and Inference for MCU-based Edge NILM: a Systematic Approach.
Enrico TabanelliDavide BrunelliAndrea AcquavivaLuca BeniniPublished in: CoRR (2021)
Keyphrases
- feature extraction
- preprocessing
- image processing
- feature space
- edge detection
- feature vectors
- feature selection
- inference process
- wavelet transform
- discriminant analysis
- extracting features
- image classification
- feature extraction and classification
- principal component analysis
- pattern recognition
- face recognition
- linear feature extraction
- computer vision
- edge information
- probabilistic inference
- texture classification
- belief networks
- pattern classification
- support vector machine svm
- dimensionality reduction
- bayesian networks
- dimension reduction
- bayesian inference
- extracted features
- linear discriminant analysis
- multiple scales
- frequency domain
- defect detection
- inference mechanism
- feature fusion