FEATURE EXTRACTION AND CLASSIFICATION
Experts
- Hemant A. Patil
- Zhong Jin
- David Zhang
- Lei Zhang
- Jian Yang
- Anshu Chittora
- Jón Atli Benediktsson
- Paul F. Whelan
- Andreas Uhl
- Paul W. Fieguth
- Marcin Grzegorzek
- Philip S. Yu
- Li Liu
- Sridhar Krishnan
- Yuan Yan Tang
- Manik Varma
- Wankou Yang
- Alan L. Yuille
- Nasir M. Rajpoot
- Larbi Boubchir
- David R. J. Snead
- Pedram Ghamisi
- Germán Castellanos-Domínguez
- Xin Zhang
- R. S. Anand
- Qijun Zhao
- Jesús García
- Shutao Li
- Adelson Chua
- Shreekant Gayaka
- Julian M. W. Quinn
- Jun Zhang
- Michael Gadermayr
- Hongzan Sun
- Hideki Noda
- Thomas S. Huang
- Jürgen Schmidhuber
- Robert DiBiano
- Saikat Basu
Venues
- CoRR
- IEEE Access
- Sensors
- Multim. Tools Appl.
- ICASSP
- Biomed. Signal Process. Control.
- EMBC
- Expert Syst. Appl.
- ICIP
- IJCNN
- Neural Comput. Appl.
- Comput. Biol. Medicine
- Pattern Recognit.
- IGARSS
- INTERSPEECH
- Pattern Recognit. Lett.
- Neurocomputing
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- Remote. Sens.
- EUSIPCO
- CinC
- IEEE Geosci. Remote. Sens. Lett.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- ICCCNT
- SIU
- Comput. Electr. Eng.
- Appl. Soft Comput.
- SMC
- CVPR
- ICDAR
- BMVC
- I2MTC
- Medical Biol. Eng. Comput.
- SN Comput. Sci.
- ICNN
- CVPR Workshops
- Image Vis. Comput.
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