FEATURE EXTRACTION AND CLASSIFICATION
Experts
- Hemant A. Patil
- Zhong Jin
- Lei Zhang
- David Zhang
- Jian Yang
- Anshu Chittora
- Nasir M. Rajpoot
- Yuan Yan Tang
- Wankou Yang
- Paul F. Whelan
- Jón Atli Benediktsson
- Alan L. Yuille
- Andreas Uhl
- Li Liu
- Larbi Boubchir
- Manik Varma
- Marcin Grzegorzek
- Paul W. Fieguth
- Philip S. Yu
- Sridhar Krishnan
- Simon Graham
- Md Mamunur Rahaman
- Salim Lahmiri
- Chen Li
- Ming Li
- Jingyu Yang
- Robert DiBiano
- Qijun Zhao
- Humayan Kabir Rana
- Ichiro Nishizaki
- Mst. Rashida Akhtar
- Madasu Hanmandlu
- Philip de Chazal
- Yusuke Tanimoto
- Bruce A. Eisenstein
- Shinya Sekizaki
- Md. Shafiul Azam
- Shutao Li
- Julian M. W. Quinn
Venues
- CoRR
- IEEE Access
- Sensors
- Multim. Tools Appl.
- ICASSP
- Biomed. Signal Process. Control.
- EMBC
- Expert Syst. Appl.
- ICIP
- IJCNN
- Comput. Biol. Medicine
- Neural Comput. Appl.
- Pattern Recognit.
- IGARSS
- Pattern Recognit. Lett.
- INTERSPEECH
- Neurocomputing
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- Remote. Sens.
- EUSIPCO
- CinC
- IEEE Geosci. Remote. Sens. Lett.
- Appl. Soft Comput.
- SIU
- SMC
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- ICCCNT
- Comput. Electr. Eng.
- I2MTC
- SN Comput. Sci.
- ICDAR
- BMVC
- Medical Biol. Eng. Comput.
- CVPR
- CVPR Workshops
- ICNN
- J. Intell. Fuzzy Syst.
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