FEATURE EXTRACTION AND CLASSIFICATION
Experts
- Hemant A. Patil
- Zhong Jin
- Jian Yang
- Anshu Chittora
- Lei Zhang
- David Zhang
- Wankou Yang
- Alan L. Yuille
- Manik Varma
- Larbi Boubchir
- Nasir M. Rajpoot
- Li Liu
- Yuan Yan Tang
- Sridhar Krishnan
- Andreas Uhl
- Paul W. Fieguth
- Paul F. Whelan
- Philip S. Yu
- Marcin Grzegorzek
- Jón Atli Benediktsson
- Mohammad Ali Moni
- Sergio A. Velastin
- George C. Runger
- Md Mamunur Rahaman
- Yasemin P. Kahya
- Paul Scheunders
- Sangram Ganguly
- Chen Li
- Ramakrishna R. Nemani
- Yusuke Tanimoto
- Zhihui Lai
- Rikky Muller
- Qian Wang
- Mostafa Jahanifar
- Stan Z. Li
- Toby P. Breckon
- Supratik Mukhopadhyay
- Jinchang Ren
- Philip de Chazal
Venues
- CoRR
- IEEE Access
- Sensors
- Multim. Tools Appl.
- ICASSP
- Biomed. Signal Process. Control.
- EMBC
- Expert Syst. Appl.
- IJCNN
- ICIP
- Comput. Biol. Medicine
- Neural Comput. Appl.
- IGARSS
- Pattern Recognit.
- Pattern Recognit. Lett.
- INTERSPEECH
- Neurocomputing
- ICPR
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Remote. Sens.
- EUSIPCO
- CinC
- IEEE Geosci. Remote. Sens. Lett.
- Appl. Soft Comput.
- SMC
- SIU
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- ICCCNT
- Comput. Electr. Eng.
- Medical Biol. Eng. Comput.
- SN Comput. Sci.
- ICDAR
- CVPR
- I2MTC
- BMVC
- BMC Bioinform.
- J. Intell. Fuzzy Syst.
- ICIC (1)
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