FEATURE EXTRACTION AND CLASSIFICATION
Experts
- Hemant A. Patil
- Zhong Jin
- Lei Zhang
- David Zhang
- Jian Yang
- Anshu Chittora
- Paul W. Fieguth
- Andreas Uhl
- Paul F. Whelan
- Philip S. Yu
- Marcin Grzegorzek
- Jón Atli Benediktsson
- Alan L. Yuille
- Wankou Yang
- Manik Varma
- Larbi Boubchir
- Nasir M. Rajpoot
- Li Liu
- Yuan Yan Tang
- Sridhar Krishnan
- Ming Li
- Justin Salamon
- Deniz Erdogmus
- Yuanqing Li
- Manohar Karki
- Thomas S. Huang
- Hideki Noda
- Hongzan Sun
- Md. Shafiul Azam
- Minghua Wan
- Saikat Basu
- Jürgen Schmidhuber
- Robert DiBiano
- Jong-Hwan Lee
- Toru Yamamoto
- Ichiro Nishizaki
- Anil K. Jain
- Yu Tao
- Jingyu Yang
Venues
- CoRR
- IEEE Access
- Sensors
- Multim. Tools Appl.
- ICASSP
- Biomed. Signal Process. Control.
- EMBC
- Expert Syst. Appl.
- ICIP
- IJCNN
- Neural Comput. Appl.
- Comput. Biol. Medicine
- Pattern Recognit.
- IGARSS
- Pattern Recognit. Lett.
- INTERSPEECH
- Neurocomputing
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Geosci. Remote. Sens.
- Remote. Sens.
- EUSIPCO
- CinC
- IEEE Geosci. Remote. Sens. Lett.
- ICCCNT
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- SIU
- Comput. Electr. Eng.
- Appl. Soft Comput.
- SMC
- CVPR
- ICDAR
- BMVC
- I2MTC
- Medical Biol. Eng. Comput.
- SN Comput. Sci.
- ICNN
- Image Vis. Comput.
- CVPR Workshops
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