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Modeling Subthreshold Leakage Current in General Transistor Networks.

Paulo F. ButzenAndré Inácio ReisChris H. KimRenato P. Ribas
Published in: ISVLSI (2007)
Keyphrases
  • special case
  • leakage current
  • social networks
  • low voltage
  • silicon dioxide
  • complex networks
  • computer systems
  • design methodology
  • electrical properties