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Test Sets for Robust Path Delay Fault Testing on Two-Rail Logic Circuits.

Kazuteru NambaHideo Ito
Published in: IEEE Trans. Computers (2011)
Keyphrases
  • test set
  • logic circuits
  • test cases
  • test data
  • error rate
  • training set
  • fault detection
  • fault diagnosis
  • low power
  • training data
  • high speed
  • power dissipation
  • face recognition
  • image restoration
  • gate array