Sign in

Embedded SRAM ring oscillator for in-situ measurement of NBTI and PBTI degradation in CMOS 6T SRAM array.

Ming-Chien TsaiYi-Wei LinHao-I YangMing-Hsien TuWei-Chiang ShihNan-Chun LienKuen-Di LeeShyh-Jye JouChing-Te ChuangWei Hwang
Published in: VLSI-DAT (2012)
Keyphrases