Reduced March iC- Test for Detecting Ageing Induced Faults in Memory Address Decoders.

Kumari Anjali Shubham Saha Anuj Grover

Published in: VLSI Design (2021)

Keyphrases

test cases
automatic detection
test data
built in self test
integrated circuit
fault detection
computational power
memory usage
real time
case study
genetic algorithm
fault diagnosis
data mining
main memory
databases
associative memory
data sets
statistical significance
test sequences
root cause