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Investigation of Semi-Rigid Coaxial Test Probes as RF Injection Devices for Immunity Tests at PCB Level.
Xinglong Wu
Flavia Grassi
Giordano Spadacini
Sergio Amedeo Pignari
Umberto Paoletti
Isao Hoda
Published in:
IEEE Access (2020)
Keyphrases
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statistical tests
test data
post hoc
test cases
higher level
levels of abstraction
test generation
multiple choice
defect detection
real time
three dimensional
test suite
test statistic
neural network