Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM.
Giuseppe Di GuglielmoFranco FummiCristina MarconciniGraziano PravadelliPublished in: IET Comput. Digit. Tech. (2007)
Keyphrases
- pattern generator
- high level
- lower level
- low level
- higher level
- test cases
- software testing
- test data
- object level
- regression testing
- semi automatic
- test case generation
- levels of abstraction
- finite state machines
- test suite
- knowledge level
- test generation
- testing process
- test data generation
- humanoid robot
- low level features
- fully automatic
- model checking
- statistically significant
- code coverage
- higher level of abstraction
- multi modal