On-chip diagnosis for early-life and wear-out failures.
Matthew BecklerR. D. (Shawn) BlantonPublished in: ITC (2012)
Keyphrases
- failure diagnosis
- root cause
- gastric cancer
- fault diagnosis
- high speed
- model based diagnosis
- low cost
- repair actions
- failure detection
- physical design
- medical diagnosis
- high density
- everyday life
- circuit design
- model based reasoning
- discrete event systems
- failure modes
- analog vlsi
- single chip
- component failures
- vlsi design
- medical diagnostic
- real time
- input output
- host computer
- automatic diagnosis
- daily life
- vlsi implementation
- failure rate