A Metric of Tolerance for the Manufacturing Defects of Threshold Logic Gates.
Sandeep DechuManoj Kumar GoparajuSpyros TragoudasPublished in: DFT (2006)
Keyphrases
- logic circuits
- quality control
- printed circuit boards
- logic programming
- automated visual inspection
- distance metric
- multi valued
- metric space
- machine vision
- classical logic
- distance function
- threshold selection
- proof theory
- manufacturing industry
- asynchronous circuits
- computational properties
- metric learning
- manufacturing systems
- modal logic
- manufacturing processes
- epistemic logic
- automated reasoning
- logical framework
- defeasible logic
- product design
- defect detection
- predicate logic
- evaluation metrics
- petri net
- defect classification