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Fault Scrambling Techniques for Yield Enhancement of Embedded Memories.
Shyue-Kung Lu
Hao-Cheng Jheng
Masaki Hashizume
Jiun-Lang Huang
Pony Ning
Published in:
Asian Test Symposium (2013)
Keyphrases
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fault diagnosis
fault detection
embedded systems
image processing
database
image analysis
multiple faults