Hao-Cheng Jheng

Publication Activity (10 Years)

Years Active: 2013-2018
Publications (10 Years): 1

Top Topics

Relational Databases

Fault Detection

Embedded Systems

Top Venues

J. Electron. Test.

Asian Test Symposium

Publications

Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume
Address Remapping Techniques for Enhancing Fabrication Yield of Embedded Memories. J. Electron. Test. 34 (4) (2018)
Shyue-Kung Lu, Hao-Cheng Jheng, Hao-Wei Lin, Masaki Hashizume, Seiji Kajihara
Built-In Scrambling Analysis for Yield Enhancement of Embedded Memories. ATS (2014)
Shyue-Kung Lu, Hao-Cheng Jheng, Masaki Hashizume, Jiun-Lang Huang, Pony Ning
Fault Scrambling Techniques for Yield Enhancement of Embedded Memories. Asian Test Symposium (2013)