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Experts
- Bassam Bamieh
- Seddik M. Djouadi
- Petros G. Voulgaris
- Ruth F. Curtain
- Jin Dong
- Jan Kautz
- Nicola Elia
- Seon Joo Kim
- Robert L. Stevenson
- Ali Jadbabaie
- Yu-Wing Tai
- Wojciech Matusik
- Simon K. Warfield
- Sunghyun Cho
- Yasuyuki Matsushita
- Seungyong Lee
- Philip H. S. Torr
- Michael S. Brown
- W. P. M. H. Heemels
- Fernando Paganini
- Azeem Sarwar
- Stefan H. J. Heijmans
- Hendrik P. A. Lensch
- Emily Jensen
- James B. Farison
- Mihailo R. Jovanovic
- Jong Chul Ye
- Michael Kaus
- Sui Tang
- Steven W. Zucker
- Anisse Taleb
- Alfredo Germani
- Miroslav Krstic
- Amritam Das
- Christopher A. Metzler
- Brandon Y. Feng
- Abhijeet Ghosh
- Song Wang
- Yinda Zhang
Venues
- CoRR
- ACC
- CDC
- IEEE Trans. Autom. Control.
- CVPR
- IEEE Trans. Image Process.
- ICASSP
- ACM Trans. Graph.
- Autom.
- Syst. Control. Lett.
- ICIP
- J. Electronic Imaging
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Multim. Tools Appl.
- Comput. Graph. Forum
- J. Geogr. Syst.
- Digital Photography
- ACCV (3)
- IEEE Trans. Computational Imaging
- ISBI
- J. Syst. Sci. Complex.
- IEEE Trans. Medical Imaging
- Symmetry
- IEEE Access
- Int. J. Comput. Vis.
- AAAI
- SIAM J. Appl. Math.
- ICPR
- ICIP (2)
- ECCV (2)
- ICCP
- Medical Imaging: Image Processing
- IEEE Trans. Vis. Comput. Graph.
- Vis. Comput.
- Int. J. Geogr. Inf. Sci.
- J. Comput. Phys.
- Digit. Signal Process.
- SIAM J. Imaging Sci.
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