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Experts
- Bassam Bamieh
- Seddik M. Djouadi
- Petros G. Voulgaris
- Jin Dong
- Jan Kautz
- Ruth F. Curtain
- Robert L. Stevenson
- Yasuyuki Matsushita
- W. P. M. H. Heemels
- Philip H. S. Torr
- Seungyong Lee
- Seon Joo Kim
- James B. Farison
- Simon K. Warfield
- Wojciech Matusik
- Michael S. Brown
- Ali Jadbabaie
- Sunghyun Cho
- Azeem Sarwar
- Stefan H. J. Heijmans
- Nicola Elia
- Yu-Wing Tai
- Hendrik P. A. Lensch
- Emily Jensen
- Fernando Paganini
- Sunyeong Kim
- M. Ehsan Raoufat
- Matthias Nießner
- Anisse Taleb
- P. Anandan
- Pasquale Palumbo
- Sui Tang
- Yuma Kinoshita
- Matthijs van Berkel
- Hyeongseok Son
- Marco Papi
- Jonghyeop Lee
- Young-In Shin
- Ferenc A. Jolesz
Venues
- CoRR
- ACC
- CDC
- IEEE Trans. Autom. Control.
- IEEE Trans. Image Process.
- CVPR
- ICASSP
- ACM Trans. Graph.
- Syst. Control. Lett.
- ICIP
- Autom.
- J. Electronic Imaging
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- Multim. Tools Appl.
- IEEE Trans. Computational Imaging
- ACCV (3)
- Digital Photography
- Comput. Graph. Forum
- J. Syst. Sci. Complex.
- ISBI
- IEEE Trans. Medical Imaging
- J. Geogr. Syst.
- AAAI
- IEEE Access
- Medical Imaging: Image Processing
- IEEE Trans. Vis. Comput. Graph.
- IEEE Control. Syst. Lett.
- ICPR
- SIAM J. Imaging Sci.
- Digit. Signal Process.
- J. Comput. Phys.
- ECCV (2)
- ICIP (2)
- SIAM J. Appl. Math.
- Symmetry
- Int. J. Geogr. Inf. Sci.
- Int. J. Comput. Vis.
- ICCP
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