SHAPE DETECTION
Experts
- Huazhong Shu
- Song-Lu Chen
- Jingying Chen
- Wenjing Jia
- Lukas Ewecker
- Huaifeng Zhang
- Simon T. Isele
- Qiang Ji
- Xiangjian He
- Siti Norul Huda Sheikh Abdullah
- Xu-Cheng Yin
- Bernard Tiddeman
- Khalid M. Hosny
- David Cristinacce
- Kin-Man Lam
- Jun-Wei Hsieh
- Stefan Roos
- Ignacio Parra
- Lars Ohnemus
- Li Wang
- Limin Luo
- Cláudio Rosito Jung
- David Fernández Llorca
- Sascha Saralajew
- Ebubekir Asan
- Miguel Ángel Sotelo
- Timothy F. Cootes
- Julian Stander
- Siddharth Agrawal
- Yao Tsorng Liu
- Minkyu Cheon
- Tomonobu Takashima
- Wei Yang
- Bogdan Tomoyuki Nassu
- Hao Ye
- Emilio L. Zapata
- Shih-Shinh Huang
- Sho Kagami
- Ziheng Wang
Venues
- CoRR
- Sensors
- Pattern Recognit.
- IEEE Trans. Intell. Transp. Syst.
- IEEE Access
- Multim. Tools Appl.
- J. Electronic Imaging
- ICPR
- Intelligent Vehicles Symposium
- ICIP
- ITSC
- MVA
- ICASSP
- Expert Syst. Appl.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- CVPR
- J. Real Time Image Process.
- ICPR (3)
- Image Vis. Comput.
- IEEE Signal Process. Lett.
- CVPR Workshops
- J. Vis. Commun. Image Represent.
- J. Comput. Sci.
- ICARCV
- FG
- WACV
- BMVC
- ICRA
- ISVC (2)
- AVSS
- IEICE Trans. Inf. Syst.
- ICME Workshops
- Comput. Graph. Forum
- SIU
- ISDFS
- J. Comput. Chem.
- CCECE
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend