OBJECT GEOMETRY
Experts
- Takahiko Horiuchi
- Shree K. Nayar
- Shoji Tominaga
- Keita Hirai
- Daniel Cohen-Or
- Gregory D. Hager
- Mariko Yamaguchi
- Helge Rhodin
- Masayoshi Kamijo
- Jiri Matas
- Tetsuro Tokunaga
- Pascal Fua
- K. Rustan M. Leino
- Medeni Soysal
- Roberto Cipolla
- Hiroshi Murase
- A. Aydin Alatan
- Frank Yu
- Takahiro Matsumoto
- Shin-Ichi Aihara
- Yasushi Yagi
- Jathushan Rajasegaran
- Adel Ahmadyan
- Hengxing Cai
- Beipeng Mu
- Wei-Shinn Ku
- Sujoy Bhore
- Keiji Kato
- Michael A. Alcorn
- Shaurya Rathore
- Daniela Rus
- Chenshen Lu
- Qing Wang
- Mathias Unberath
- Sourya Dipta Das
- Andreas Wiese
- Daeyun Shin
- Jian Cheng
- Malte Mosbach
Venues
- CoRR
- CVPR
- ICRA
- ICCV
- IROS
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- BMVC
- IEEE Trans. Vis. Comput. Graph.
- ACM Trans. Graph.
- SEFM
- Systems and Computers in Japan
- UIST
- Vis. Comput.
- VAST
- Sensors
- WACV
- IEEE Access
- ICASSP
- OOPSLA
- CIC
- IJCAI
- OOPS Messenger
- Material Appearance
- ICPR
- SIGGRAPH Talks
- CVPR (1)
- ACCV (2)
- IEEE Trans. Geosci. Remote. Sens.
- Int. J. Pattern Recognit. Artif. Intell.
- CGIV
- Image Vis. Comput.
- ROBIO
- CDC
- SIGGRAPH Research Posters
- Medical Image Anal.
- ECCV (2)
- ISMM
- ISCIS
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