OBJECT DETECTION AND TRACKING
Experts
- Peter H. N. de With
- Jie Zhou
- Andrew Zisserman
- Dawei Du
- Tat-Seng Chua
- Ioannis Kompatsiaris
- Xindi Shang
- Jungong Han
- Rama Chellappa
- Bastian Leibe
- Deva Ramanan
- Achal Dave
- Longyin Wen
- Nassir Navab
- Hannes Fassold
- Michael G. Strintzis
- Baoxin Li
- Jiwen Lu
- Giuseppe Boccignone
- Zuxuan Wu
- Ling Shao
- Tarasha Khurana
- Jonathon Luiten
- Qinghua Hu
- Pengfei Zhu
- Qingming Huang
- Marcus Baum
- Hauke Kaulbersch
- A. Enis Çetin
- Yizhi Liu
- Junlin Ouyang
- Andrea Cavallaro
- Jean-Charles Bazin
- Roland Siegwart
- Alexander Sorkine-Hornung
- Yu-Gang Jiang
- Vasileios Mezaris
- Luc Van Gool
- B. Ugur Töreyin
Venues
- CoRR
- ICIP
- CVPR
- IEEE Access
- Sensors
- ACM Multimedia
- AVSS
- Multim. Tools Appl.
- ICCV
- ICRA
- IEEE Trans. Circuits Syst. Video Technol.
- CVPR Workshops
- ICME
- IROS
- ICASSP
- ITSC
- IEEE Trans. Intell. Transp. Syst.
- FUSION
- BMVC
- WACV
- EMBC
- Comput. Vis. Image Underst.
- ISCAS
- Image Vis. Comput.
- Signal Image Video Process.
- ICPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- J. Electronic Imaging
- ICIAP
- IEEE Trans. Vis. Comput. Graph.
- IV
- EUSIPCO
- Remote. Sens.
- J. Vis. Commun. Image Represent.
- Comput. Electron. Agric.
- ISVC (2)
- AAAI
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