IMPROVE RECOGNITION ACCURACY
Experts
- Trevor Darrell
- Tsuhan Chen
- Alan L. Yuille
- Jeng-Shyang Pan
- Cihang Xie
- Seyed Omid Shahdi
- Juan Dendarieta
- Eduardo Montijano
- Jun Huan
- Mohammad Saeed Ebrahimi Saadabadi
- Jieru Mei
- Ghulam Sakhi Shokouh
- Xianhang Li
- Valentina V. Zharkova
- Christopher D. Twigg
- Dong Chen
- Harald Kosch
- Slobodan Ilic
- Chen Wei
- Pan Zhang
- Zhengyuan Yang
- Xingran Zhou
- Stan Z. Li
- Bo Zhang
- Yuting Ye
- Wendi Cross
- Nasser M. Nasrabadi
- Sergey Zakharov
- Xiaogang Wang
- Zhen Lei
- Qifeng Chen
- Sebastian Thrun
- Yoshihiro Kanamori
- Boguslaw Cyganek
- Ryan Farrell
- Mariana-Iuliana Georgescu
- Ning Zhang
- Roseli A. F. Romero
- Qingzhong Wang
Venues
- CoRR
- CVPR
- Sensors
- CVPR Workshops
- IEEE Trans. Pattern Anal. Mach. Intell.
- Int. J. Pattern Recognit. Artif. Intell.
- IROS
- MVA
- WACV
- BMVC
- ICME
- ICPR
- ICTAI
- ACM Multimedia
- Multim. Tools Appl.
- INTERSPEECH
- IJCAI
- ICDAR
- EMBC
- Systems and Computers in Japan
- ICRA
- IEEE Access
- J. Chem. Inf. Model.
- AAAI
- ICIAP
- DRR
- ICASSP
- ICCV
- ICIP
- Multim. Syst.
- AAAI/IAAI
- IEICE Trans. Inf. Syst.
- SBRN
- IEEE Trans. Cybern.
- IAT
- GfKl
- ICPP (3)
- GIL Jahrestagung
- ICCSA (5)
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