IMPROVE RECOGNITION ACCURACY
Experts
- Tsuhan Chen
- Alan L. Yuille
- Trevor Darrell
- Xianhang Li
- Ghulam Sakhi Shokouh
- Valentina V. Zharkova
- Christopher D. Twigg
- Seyed Omid Shahdi
- Jeng-Shyang Pan
- Cihang Xie
- Jieru Mei
- Jun Huan
- Mohammad Saeed Ebrahimi Saadabadi
- Juan Dendarieta
- Eduardo Montijano
- Bo Zhang
- Stan Z. Li
- Xingran Zhou
- Zhengyuan Yang
- Wendi Cross
- Nasser M. Nasrabadi
- Yuting Ye
- Slobodan Ilic
- Harald Kosch
- Dong Chen
- Chen Wei
- Pan Zhang
- Boguslaw Cyganek
- Qingzhong Wang
- Roseli A. F. Romero
- Mariana-Iuliana Georgescu
- Ning Zhang
- Ryan Farrell
- Xiaogang Wang
- Sergey Zakharov
- Yoshihiro Kanamori
- Sebastian Thrun
- Qifeng Chen
- Zhen Lei
Venues
- CoRR
- CVPR
- Sensors
- CVPR Workshops
- IEEE Trans. Pattern Anal. Mach. Intell.
- MVA
- Int. J. Pattern Recognit. Artif. Intell.
- IROS
- ICTAI
- BMVC
- WACV
- ICPR
- ICME
- ICIAP
- Systems and Computers in Japan
- ICRA
- Multim. Tools Appl.
- ACM Multimedia
- ICDAR
- IJCAI
- EMBC
- INTERSPEECH
- ICCV
- ICASSP
- Multim. Syst.
- ICIP
- AAAI
- J. Chem. Inf. Model.
- IEEE Access
- DRR
- ECCV (32)
- AIMSA
- IET Image Process.
- IPMU
- BIOSIGNALS
- ICCSA (4)
- Signal Process. Image Commun.
- IJCB
- Soft Comput.
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