FORCE FIELD
Experts
- Alexander D. MacKerell Jr.
- Mark S. Nixon
- Adam Liwo
- Wilfred F. van Gunsteren
- Anthony J. Yezzi
- Harold A. Scheraga
- Scott T. Acton
- Josiane Zerubia
- Guirong Weng
- Michel Barlaud
- Jean-Philippe Thiran
- Yiquan Wu
- Kwang Nam Choi
- Allen R. Tannenbaum
- Laurent D. Cohen
- Xavier Bresson
- Hai-Feng Chen
- Cezary Czaplewski
- Stanislaw Oldziej
- Ian H. Jermyn
- Yuanquan Wang
- Xianghua Xie
- Philippe H. Hünenberger
- Bin Han
- Ahmad A. Masoud
- Dimitris N. Metaxas
- Chunming Li
- Hao Liu
- Paul W. Fieguth
- John N. Carter
- Ray Luo
- Laurent Peyrodie
- Shafiullah Soomro
- Kenno Vanommeslaeghe
- Steve R. Gunn
- Karl N. Kirschner
- Piotr Cieplak
- Wei Zhang
- Farhan Akram
Venues
- J. Comput. Chem.
- CoRR
- J. Chem. Inf. Model.
- ICRA
- ICIP
- J. Comput. Aided Mol. Des.
- IROS
- IEEE Access
- IEEE Trans. Image Process.
- Pattern Recognit. Lett.
- ISBI
- CVPR
- Pattern Recognit.
- ICPR
- Multim. Tools Appl.
- Sensors
- SMC
- EMBC
- Medical Imaging: Image Processing
- Signal Process.
- J. Electronic Imaging
- ACC
- IET Image Process.
- BMVC
- Int. J. Comput. Vis.
- ICCV
- EUSIPCO
- ICIP (2)
- IEEE Trans. Pattern Anal. Mach. Intell.
- Expert Syst. Appl.
- Signal Image Video Process.
- IGARSS
- Comput. Phys. Commun.
- PLoS Comput. Biol.
- IEEE Trans. Medical Imaging
- IEEE Trans. Instrum. Meas.
- ROBIO
- IEEE Internet Things J.
- ICIP (1)
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