FINE SCALE
Experts
- Hans-Peter Seidel
- Minoru Asada
- Michael Goesele
- Matthias Nießner
- Aswin C. Sankaranarayanan
- Jan Kautz
- Han Wang
- Yao Yao
- Gyeongmin Choe
- Zhuo Hui
- Péter Balázs
- Djamchid Ghazanfarpour
- Peter J. Giblin
- Qing Xiao
- Chunhui Zhao
- Leonidas J. Guibas
- Sunghee Kim
- Evangelos Kalogerakis
- Ioannis G. Kevrekidis
- Takayuki Nakamura
- Yoshiaki Shirai
- Difan Liu
- Hong Qin
- Victoria Interrante
- Ye Hong
- Szymon Rusinkiewicz
- Haleh Hagh-Shenas
- Gopal Sharma
- Steven W. Zucker
- Christian Theobalt
- Subhransu Maji
- Rishabh Goyal
- Martin Rumpf
- Youngjin Yoon
- Dacheng Tao
- Martin Lenz
- Varun Gangal
- Benjamin Ummenhofer
- Gregorio Farolfi
Venues
- CoRR
- Remote. Sens.
- CVPR
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Access
- Comput. Graph. Forum
- Sensors
- ACM Trans. Graph.
- IGARSS
- Pattern Recognit. Lett.
- Multiscale Model. Simul.
- IEEE Trans. Vis. Comput. Graph.
- Int. J. Appl. Earth Obs. Geoinformation
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- ICIP
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Comput. Phys.
- ICRA
- IEEE Trans. Instrum. Meas.
- Comput. Aided Des.
- Vis. Comput.
- Image Vis. Comput.
- Int. J. Comput. Vis.
- IEEE Geosci. Remote. Sens. Lett.
- IROS
- ICASSP
- Expert Syst. Appl.
- Comput. Graph.
- Entropy
- VMV
- IJCNN
- Comput. Vis. Image Underst.
- PLoS Comput. Biol.
- Trans. GIS
- J. Math. Imaging Vis.
- ICCV
- Ecol. Informatics
- ICPR
- ISCAS
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