FINE SCALE
Experts
- Hans-Peter Seidel
- Gyeongmin Choe
- Jan Kautz
- Yao Yao
- Zhuo Hui
- Michael Goesele
- Minoru Asada
- Matthias Nießner
- Han Wang
- Aswin C. Sankaranarayanan
- Gopal Sharma
- Evangelos Kalogerakis
- Rishabh Goyal
- Christian Theobalt
- Difan Liu
- Peter J. Giblin
- Steven W. Zucker
- Chunhui Zhao
- Hong Qin
- Subhransu Maji
- Haleh Hagh-Shenas
- Djamchid Ghazanfarpour
- Victoria Interrante
- Qing Xiao
- Leonidas J. Guibas
- Sunghee Kim
- Ioannis G. Kevrekidis
- Ye Hong
- Szymon Rusinkiewicz
- Yoshiaki Shirai
- Takayuki Nakamura
- Péter Balázs
- Pak-Wai Chan
- Ronen Basri
- David Zhang
- Varun Gangal
- Cong Shen
- Martin Rumpf
- Xingchao Peng
Venues
- CoRR
- Remote. Sens.
- CVPR
- IEEE Trans. Geosci. Remote. Sens.
- IEEE Access
- Comput. Graph. Forum
- ACM Trans. Graph.
- Sensors
- IGARSS
- Pattern Recognit. Lett.
- IEEE Trans. Vis. Comput. Graph.
- Int. J. Appl. Earth Obs. Geoinformation
- IEEE Trans. Pattern Anal. Mach. Intell.
- J. Comput. Phys.
- ICIP
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Comput. Aided Des.
- Multiscale Model. Simul.
- Image Vis. Comput.
- IEEE Trans. Instrum. Meas.
- Vis. Comput.
- ICASSP
- IEEE Geosci. Remote. Sens. Lett.
- ICRA
- IROS
- Int. J. Comput. Vis.
- ICCV
- J. Math. Imaging Vis.
- Entropy
- Trans. GIS
- PLoS Comput. Biol.
- ICPR
- VMV
- Ecol. Informatics
- Comput. Vis. Image Underst.
- IJCNN
- Int. J. Digit. Earth
- J. Comput. Appl. Math.
- ICIP (3)
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