FINAL STAGE
Experts
- Emil Levi
- Atif Iqbal
- Bernard Boutin
- Aneesh Sobhanan
- Martin Jones
- Anita Burgun
- Christian Jacquelinet
- Pierre Le Beux
- Fernando M. Duarte
- Denis Delamarre
- Takashi Inoue
- Sidonie F. Costa
- Nandor Bodo
- Shu Namiki
- José A. Covas
- Mark Pelusi
- Deepa Venkitesh
- Sami Djabbour
- Ayslan Caisson Norões Maia
- Peter Williams
- David Naso
- Zdzislaw Gosiewski
- Atila Alvandpour
- Ryuichi Sugizaki
- Miguel Angel Benalcázar Hernández
- A. Sarma
- Abdelmajid Farchi
- Francesco Pesce
- René Rathfelder
- Jiaxuan Huang
- Ravinder David Koilpillai
- Robert Balzer
- Emad Malaekah
- Wei Shu
- Cédric M. Campos
- Lakshmi Narayanan Venkatasubramani
- Zheng-An Peng
- Francisco del Cerro Velázquez
- Pierre Rampal
Venues
- OFC
- IEEE Access
- IECON
- IEEE Trans. Ind. Electron.
- Qual. Reliab. Eng. Int.
- Expert Syst. Appl.
- Eur. J. Oper. Res.
- IEEE Trans. Very Large Scale Integr. Syst.
- MWSCAS
- AMCIS
- ASCC
- Sensors
- Comput.
- AFIPS National Computer Conference
- DFT
- IJCNN
- ISCAS
- Reliab. Eng. Syst. Saf.
- ICTA
- IEEE Trans. Inf. Theory
- ISMIR
- ISCAS (6)
- DATE
- AMIA
- ACIS
- J. Am. Soc. Inf. Sci.
- CDC
- MMAR
- ICEIC
- Symmetry
- Wirel. Pers. Commun.
- J. Comput. Phys.
- Artif. Intell. Medicine
- ISPW
- SIGGRAPH Art Gallery
- IDA
- Microelectron. Reliab.
- Trans. Inst. Meas. Control
- OFC/NFOEC
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