FALSE DETECTIONS
Experts
- Don Towsley
- Dong Wang
- Marco Lops
- Bernt Schiele
- Simon S. Woo
- Nassir Navab
- Junzhou Zhao
- Iljoo Baek
- Xinguo Yu
- Youngoh Bang
- Xiaohong Guan
- Cuneyt Akinlar
- Pinghui Wang
- John C. S. Lui
- Yue Sun
- Emanuele Grossi
- Changsheng Xu
- Dawei Du
- Abdelsalam Helal
- Cihan Topal
- Pengfei Zhu
- Hyeonseong Jeon
- Longyin Wen
- Mykhaylo Andriluka
- Ovidiu Vaduvescu
- Feng Zhou
- Raja Bose
- Branko Ristic
- Neil J. Gordon
- Ragunathan Rajkumar
- Nikos Grammalidis
- Weijian Liu
- Qinghua Hu
- David Middleton
- Luca Venturino
- Peter H. N. de With
- Mauro Barni
- Kun Liu
- Jia Liu
Venues
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- IEEE Access
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- Comput. Electron. Agric.
- IEEE Trans. Inf. Theory
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- IEEE Trans. Instrum. Meas.
- Pattern Recognit. Lett.
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- IEEE Trans. Medical Imaging
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- IEEE Signal Process. Lett.
- Intelligent Vehicles Symposium
- Multim. Tools Appl.
- ICME
- Neural Comput. Appl.
- ITSC
- ISCAS
- Pattern Anal. Appl.
- Medical Imaging: Computer-Aided Diagnosis
- WACV
- IEEE Trans. Signal Process.
- SIU
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
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