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Experts
- Greg E. Mellen
- John Impagliazzo
- Robert L. Glass
- H. Gary Knight
- Muhammad Sarfraz
- Yasser Alayli
- Igal Sason
- Elie Inaty
- James F. Blinn
- Ahmad Abdul Majid
- Bert Jüttler
- Vincent Lepetit
- Olivier Rioul
- Patrick J. Bonnin
- Robin R. Murphy
- Nicolai Petkov
- Eng-Wee Chionh
- Rabih Al Nachar
- Peter Corcoran
- Tamal K. Dey
- M. B. Clowes
- Davide Migliore
- Rolf Frantz
- Ruizhen Hu
- Ardeshir Goshtasby
- Yongjun Zhang
- Noriaki Oda
- James L. Hafner
- Giuseppe Papari
- Joseph O'Rourke
- Pui-In Mak
- Fabio Bellavia
- Mohammad Asiful Hossain
- Hiroshi Hirai
- David N. Card
- Simeon Bamford
- Jorge L. C. Sanz
- Domenico Tegolo
- Youngmin Baek
Venues
- CoRR
- Cryptologia
- J. Syst. Softw.
- Inroads
- Comput. Aided Geom. Des.
- IEEE Trans. Image Process.
- Comput. Aided Des.
- Pattern Recognit.
- Pattern Recognit. Lett.
- Commun. ACM
- IEEE Robotics Autom. Mag.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IJCAI
- ICARCV
- IEEE Trans. Geosci. Remote. Sens.
- ICIP
- IEEE Computer Graphics and Applications
- ICPR
- IEEE Signal Process. Mag.
- Comput. Chem.
- Multim. Tools Appl.
- CAD/Graphics
- Remote. Sens.
- Robotics Auton. Syst.
- Image Vis. Comput.
- Vis. Comput.
- ICAISC (1)
- IROS
- CGIV
- Comput. J.
- ACM Trans. Graph.
- CVPR
- IEEE Consumer Electron. Mag.
- ROBIO
- J. Symb. Comput.
- DICTA
- ICIAR (1)
- CVGIP Graph. Model. Image Process.
- 计算机科学
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