CONTOUR SEGMENTS
Experts
- Marcin Grzegorzek
- Cong Yang
- Oliver Tiebe
- Wen Yang
- Yoshiaki Shirai
- Daniel Schikore
- Yung-Kuan Chan
- Takayuki Nakamura
- Valerio Pascucci
- Christian Feinen
- Chandrajit L. Bajaj
- Vittorio Ferrari
- Minoru Asada
- Takashi Akutsu
- Lin Ma
- Hui Wei
- Christiane Neuschaefer-Rube
- Chin-Chen Chang
- Yang Zhao
- Vikas Chandra
- Jie Qin
- Laura Gustafson
- Alan L. Yuille
- Dinei A. F. Florêncio
- Édouard Oudet
- Guohua Geng
- Xian-Sheng Hua
- Fanyi Xiao
- Linhui Jia
- David B. Cooper
- Jabeom Koo
- Xiaoliang Xiong
- Shys-Fan Yang-Mao
- Raik Grützner
- Yukiko Kenmochi
- Mykolas J. Bilinskas
- Zhixiang Liang
- Mingquan Zhou
- Hang Li
Venues
- CoRR
- ICIP
- Pattern Recognit.
- ICCV
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- SIGGRAPH Visual Proceedings
- IEEE Signal Process. Lett.
- Systems and Computers in Japan
- Comput. Graph. Forum
- IEEE Access
- INTERSPEECH
- Image Vis. Comput.
- Pattern Recognit. Lett.
- ACM Trans. Graph.
- IET Image Process.
- Appl. Math. Comput.
- Int. J. Inf. Technol. Decis. Mak.
- IJCAI
- ECCV
- ECCV (6)
- IROS
- J. Multivar. Anal.
- Human Vision and Electronic Imaging
- Signal Process.
- ICIP (3)
- Living Machines
- Entropy
- Image Process. Line
- ECCV (3)
- Expert Syst. Appl.
- CICC
- Comput. Vis. Image Underst.
- Mach. Vis. Appl.
- AAAI
- ICPR
- HAIS
- ACM National Conference
- ISVC (1)
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