CONTOUR SEGMENTS
Experts
- Oliver Tiebe
- Marcin Grzegorzek
- Cong Yang
- Christian Feinen
- Vittorio Ferrari
- Valerio Pascucci
- Takayuki Nakamura
- Yoshiaki Shirai
- Daniel Schikore
- Wen Yang
- Minoru Asada
- Yung-Kuan Chan
- Chandrajit L. Bajaj
- N. Zavalishin
- Barak Itkin
- Morimichi Nishigaki
- Xi Chen
- Oguzhan Guclu
- Shiu Yin Yuen
- Jonas Lukasczyk
- Wisnu Jatmiko
- Nachum Dershowitz
- Constantijn Kaland
- Kenichi Arakawa
- Qing Wang
- Antoine Vacavant
- Phuc Ngo
- Brian P. Otis
- Bala Varadarajan
- David Coeurjolly
- Fei Sun
- Luc Van Gool
- Kang B. Sun
- Xiuwen Liu
- Tim Weyrich
- Lin Li
- Yanshan Li
- Xiaobai Liu
- Jianzhuang Liu
Venues
- CoRR
- ICIP
- ICCV
- CVPR
- IEEE Trans. Pattern Anal. Mach. Intell.
- Pattern Recognit.
- SIGGRAPH Visual Proceedings
- Pattern Recognit. Lett.
- IEEE Access
- Comput. Graph. Forum
- IEEE Signal Process. Lett.
- Systems and Computers in Japan
- Image Vis. Comput.
- INTERSPEECH
- Entropy
- ROCLING
- BIBM
- SIU
- Int. J. Pattern Recognit. Artif. Intell.
- SSPR/SPR
- IET Image Process.
- ACM Trans. Graph.
- Human Vision and Electronic Imaging
- ICPR (1)
- ICCVG
- AAAI
- Appl. Math. Comput.
- ISCAS
- CRV
- ISSPA
- CGIV
- Comput. J.
- Int. J. Inf. Technol. Decis. Mak.
- ISVC (2)
- Medical Image Anal.
- ACCV (4)
- Int. J. Comput.
- J. Vis. Commun. Image Represent.
- ACM National Conference
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