Zhen Liu

Publication Activity (10 Years)

Years Active: 2013-2024
Publications (10 Years): 17

Top Topics

Nearest Neighbor

Fault Diagnosis

Analog Circuits

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Bo Xu, Hang Geng, Leping Jiang, Songting Zou, Kai Chen, Zhen Liu
FPGA Implementation of Memristor Emulators Using Fractional Order Calculus: A High-Precision Reconfigurable Approach. IEEE Trans. Circuits Syst. I Regul. Pap. 71 (4) (2024)
Wenjuan Mei, Zhen Liu, Ouhang Li, Yuanzhang Su, Yusong Mei, Yongji Long
Mixture test strategy optimization for analog systems. Frontiers Inf. Technol. Electron. Eng. 24 (9) (2023)
Wenjuan Mei, Zhen Liu, Chaowu Pan, Ouhang Li, Yuanzhang Su, Qi Zhou
Double-Phase Adaptive Neural Network for Condition-Based Monitoring of p-GaN HEMT Under Repetitive Short-Circuit Stresses. IEEE Trans. Instrum. Meas. 72 (2023)
Pengbin Yang, Xiuyun Zhou, Ruijie He, Zhen Liu
Curves-Based Similarity Method (CBSM) for Defect Depth Quantization. IEEE Trans. Instrum. Meas. 72 (2023)
Wenjuan Mei, Chaowu Pan, Zhen Liu, Yuanzhang Su, Yusong Mei, Qi Zhou
Trap Dynamic Detection of GaN HEMT under Repetitive Short Circuit Degradation. I2MTC (2023)
Wenjuan Mei, Zhen Liu, Lei Tang, Yuanzhang Su
Test Strategy Optimization Based on Soft Sensing and Ensemble Belief Measurement. Sensors 22 (6) (2022)
Wenjuan Mei, Zhen Liu, Yuanzhang Su
MRPM: Multistep Robust Prediction Machine for Degradation Time Series Projection. I2MTC (2021)
Wenjuan Mei, Yuanzhang Su, Zhen Liu
Correntropy-based Aligned Predictor for Degradation Prognosis. CAA SAFEPROCESS (2021)
Quan Zhou, Lulu Chen, Rui Li, Yuhua Cheng, Zhen Liu
Bipartite containment control for discrete-time second-order multiagent systems with time-varying delays on switching signed topologies. Neurocomputing 417 (2020)
Wenjuan Mei, Zhen Liu, Yuanzhang Su, Li Du, Jianguo Huang
Evolved-Cooperative Correntropy-Based Extreme Learning Machine for Robust Prediction. Entropy 21 (9) (2019)
Chenglin Yang, Zhen Liu, Cong Hu
Fault Diagnosis of Analog Filter Circuit Based on Genetic Algorithm. IEEE Access 7 (2019)
Zhen Liu, Yuhua Cheng, Pan Wang, Yilu Yu, Yiwen Long
A method for remaining useful life prediction of crystal oscillators using the Bayesian approach and extreme learning machine under uncertainty. Neurocomputing 305 (2018)
Wenjuan Mei, Zhen Liu, Yuhua Cheng, Yangzhen Zhang
A MDPSO-Based Constructive ELM Approach With Adjustable Influence Value. IEEE Access 6 (2018)
Zhen Liu, Wenjuan Mei, Xianping Zeng, Chenglin Yang, Xiuyun Zhou
Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data. Sensors 17 (11) (2017)
Liyue Yan, Houjun Wang, Zhen Liu, Jingyu Zhou, Bing Long
A Novel Noise-assisted Prognostic Method for Linear Analog Circuits. J. Electron. Test. 33 (5) (2017)
Zhen Liu, Qing Wang, Chenliang Song, Yuhua Cheng
Similarity-Based Difference Analysis Approach for Remaining Useful Life Prediction of GaAs-Based Semiconductor Lasers. IEEE Access 5 (2017)
Zhen Liu, Xianping Zeng, Yuhua Cheng, Sensen Song
Spline cell-based hidden Markov approach for singular time series forecasting in performance degradation trend analysis. I2MTC (2016)
Chenglin Yang, Jing Yang, Zhen Liu, Shulin Tian
Complex Field Fault Modeling-Based Optimal Frequency Selection in Linear Analog Circuit Fault Diagnosis. IEEE Trans. Instrum. Meas. 63 (4) (2014)
Shulin Tian, Chenglin Yang, Fang Chen, Zhen Liu
Circle Equation-Based Fault Modeling Method for Linear Analog Circuits. IEEE Trans. Instrum. Meas. 63 (9) (2014)
Chenglin Yang, Junhao Yan, Bing Long, Zhen Liu
A novel test optimizing algorithm for sequential fault diagnosis. Microelectron. J. 45 (6) (2014)
Bing Long, Weiming Xian, Lin Jiang, Zhen Liu
An improved autoregressive model by particle swarm optimization for prognostics of lithium-ion batteries. Microelectron. Reliab. 53 (6) (2013)
Chenglin Yang, Shulin Tian, Zhen Liu, Jianguo Huang, Fang Chen
Fault Modeling on Complex Plane and Tolerance Handling Methods for Analog Circuits. IEEE Trans. Instrum. Meas. 62 (10) (2013)