Login / Signup
A Novel Noise-assisted Prognostic Method for Linear Analog Circuits.
Liyue Yan
Houjun Wang
Zhen Liu
Jingyu Zhou
Bing Long
Published in:
J. Electron. Test. (2017)
Keyphrases
</>
detection method
noise level
significant improvement
input data
closed form
noise free
machine learning
similarity measure
objective function
object oriented
signal processing
segmentation method
matching algorithm