Fault Modeling on Complex Plane and Tolerance Handling Methods for Analog Circuits.
Chenglin YangShulin TianZhen LiuJianguo HuangFang ChenPublished in: IEEE Trans. Instrum. Meas. (2013)
Keyphrases
- computationally intensive
- computational cost
- analog circuits
- significant improvement
- preprocessing
- three dimensional
- machine learning
- empirical studies
- fault diagnosis
- computationally expensive
- high level
- artificial intelligence
- real time
- knowledge representation
- knowledge acquisition
- benchmark datasets
- real world
- data sets