Yeh-Ning Jou

Publication Activity (10 Years)

Years Active: 2008-2023
Publications (10 Years): 5

Top Topics

Operating Conditions

Measurement Errors

Top Venues

Publications

Shao-Chang Huang, Chien-Wei Wang, Chih-Hsuan Lin, Kai-Chieh Hsu, Ching-Ho Li, Chih-Cherng Liao, Jung-Tsun Chuang, Gong-Kai Lin, Lin-Fan Chen, Chun-Chih Chen, Yeh-Ning Jou, Jian-Hsing Lee, Ke-Horng Chen
Transmission Line Pulse Width Impacting on Device Performances. ICCE-Taiwan (2023)
Shao-Chang Huang, Kai-Chieh Hsu, Chih-Hsuan Lin, Chien-Wei Wang, Ching-Ho Li, Chih-Cherng Liao, Jung-Tsun Chuang, Gong-Kai Lin, Lin-Fan Chen, Chun-Chih Chen, Yeh-Ning Jou, Jian-Hsing Lee, Ke-Horng Chen
Bipolar Transistors' Holding Phenomena. ICCE-Taiwan (2023)
Shao-Chang Huang, Jian-Hsing Lee, Chun-Chih Chen, Ching-Ho Li, Chih-Cherng Liao, Kai-Chieh Hsu, Gong-Kai Lin, Li-Fan Chen, Chien-Wei Wang, Chih-Hsuan Lin, Yeh-Ning Jou, Ke-Horng Chen
Gate Voltages Impacting on Latch-up Measurements. ICCE-TW (2022)
Jian-Hsing Lee, Yeh-Jen Huang, Li-Yang Hong, Li-Fan Chen, Yeh-Ning Jou, Shin-Cheng Lin, Walter Wohlmuth, Chih-Cherng Liao, Ching-Ho Li, Shoa-Chang Huang, Ke-Horng Chen
Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN HEMT for All-Terminal ESD Protection. IRPS (2022)
Shao-Chang Huang, Chih-Cherng Liao, Hsien-Feng Liao, Shou-Peng Weng, Karuna Nidhi, Yu-Kai Wang, Yi-Jen Chen, Hwa-Chyi Chiou, Yeh-Ning Jou, Jian-Hsing Lee
Analyzing Gate-Driven Circuit Parameters for Adding ESD Performances. ICCE-TW (2019)
Seian-Feng Liao, Kai-Neng Tang, Ming-Dou Ker, Jia-Rong Yeh, Hwa-Chyi Chiou, Yeh-Jen Huang, Chun-Chien Tsai, Yeh-Ning Jou, Geeng-Lih Lin
Impact of guard ring layout on the stacked low-voltage PMOS for high-voltage ESD protection. ECCTD (2015)
Wen-Yi Chen, Ming-Dou Ker, Yeh-Ning Jou, Yeh-Jen Huang, Geeng-Lih Lin
Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by Body Current Injection. ISCAS (2009)
Wen-Yi Chen, Ming-Dou Ker, Yeh-Jen Huang, Yeh-Ning Jou, Geeng-Lih Lin
Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration. APCCAS (2008)