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Measurement on snapback holding voltage of high-voltage LDMOS for latch-up consideration.

Wen-Yi ChenMing-Dou KerYeh-Jen HuangYeh-Ning JouGeeng-Lih Lin
Published in: APCCAS (2008)
Keyphrases
  • high voltage
  • operating conditions
  • normal operation
  • power consumption
  • partial discharge
  • steady state
  • high density
  • management system