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Improvement on ESD Robustness of Lateral DMOS in High-voltage CMOS ICs by Body Current Injection.

Wen-Yi ChenMing-Dou KerYeh-Ning JouYeh-Jen HuangGeeng-Lih Lin
Published in: ISCAS (2009)
Keyphrases
  • high voltage
  • low voltage
  • human body
  • real time
  • neural network
  • machine learning
  • low cost
  • low power
  • normal operation
  • data mining
  • fault diagnosis
  • power consumption
  • image sensor
  • circuit design
  • partial discharge