Y. Roizin

Publication Activity (10 Years)

Years Active: 2017-2017
Publications (10 Years): 1

Top Topics

Gate Dielectrics

Chemical Vapor Deposition

Electrical Properties

High Temperature

Top Venues

Microelectron. Reliab.

Publications

M. Lisiansky, Y. Raskin, Y. Roizin, B. Meyler, S. Yofis, Y. Shneider
gate dielectric stack. Microelectron. Reliab. 79 (2017)