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Xuerong Ye
ORCID
Publication Activity (10 Years)
Years Active: 2006-2023
Publications (10 Years): 18
Top Topics
Fault Diagnosis
Reliability Assessment
Initial State
Joint Distribution
Top Venues
Microelectron. Reliab.
Qual. Reliab. Eng. Int.
IEEE Access
Reliab. Eng. Syst. Saf.
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Publications
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Cen Chen
,
Chengzhi Sun
,
Liqin Wu
,
Xuerong Ye
,
Guofu Zhai
Model-based quality consistency analysis of permanent magnet synchronous motor cogging torque in wide temperature range.
Qual. Reliab. Eng. Int.
39 (8) (2023)
Xuerong Ye
,
Qisen Sun
,
Wenwen Li
,
Guofu Zhai
Life prediction of lithium thionyl chloride batteries based on the pulse load test and accelerated degradation test.
Qual. Reliab. Eng. Int.
39 (8) (2023)
Bokai Zheng
,
Cen Chen
,
Yigang Lin
,
Xuerong Ye
,
Guofu Zhai
Reliability Analysis Based on a Bivariate Degradation Model Considering Random Initial State and Its Correlation With Degradation Rate.
IEEE Trans. Reliab.
72 (1) (2023)
Bokai Zheng
,
Cen Chen
,
Yigang Lin
,
Yifan Hu
,
Xuerong Ye
,
Guofu Zhai
,
Enrico Zio
Optimal design of step-stress accelerated degradation test oriented by nonlinear and distributed degradation process.
Reliab. Eng. Syst. Saf.
217 (2022)
Xuerong Ye
,
Yifan Hu
,
Bokai Zheng
,
Cen Chen
,
Guofu Zhai
A new class of multi-stress acceleration models with interaction effects and its extension to accelerated degradation modelling.
Reliab. Eng. Syst. Saf.
228 (2022)
Cen Chen
,
Yun Yang
,
Xuerong Ye
,
Guofu Zhai
Soft Fault Diagnosis Using URV-LDA Transformed Feature Dictionary.
IEEE Access
9 (2021)
Xuerong Ye
,
Yifan Hu
,
Junxian Shen
,
Cen Chen
,
Guofu Zhai
An Adaptive Optimized TVF-EMD Based on a Sparsity-Impact Measure Index for Bearing Incipient Fault Diagnosis.
IEEE Trans. Instrum. Meas.
70 (2021)
Yun Yang
,
Cen Chen
,
Xuerong Ye
,
Chengzhi Sun
An Excitation Method for Fault Diagnosis of DC-AC Converter Based on Simulation.
I2MTC
(2021)
Guofu Zhai
,
Bokai Zheng
,
Xuerong Ye
,
Shuang Si
,
Enrico Zio
A failure mechanism consistency test method for accelerated degradation test.
Qual. Reliab. Eng. Int.
37 (2) (2021)
Xuerong Ye
,
Hao Chen
,
Cen Chen
,
Guofu Zhai
Life-Cycle Dynamic Robust Design Optimization for Batch Production of Permanent Magnet Actuator.
IEEE Trans. Ind. Electron.
68 (10) (2021)
Xuerong Ye
,
Yifan Hu
,
Junxian Shen
,
Rui Feng
,
Guofu Zhai
An Improved Empirical Mode Decomposition Based on Adaptive Weighted Rational Quartic Spline for Rolling Bearing Fault Diagnosis.
IEEE Access
8 (2020)
Xuerong Ye
,
Cen Chen
,
Guofu Zhai
Fault localization of a switched mode power supply based on extended integer-coded dictionary method.
Microelectron. Reliab.
(2018)
Xuerong Ye
,
Cen Chen
,
Yixing Wang
,
L. Wang
,
Guofu Zhai
VDMOSFET HEF degradation modelling considering turn-around phenomenon.
Microelectron. Reliab.
80 (2018)
Xuerong Ye
,
Yigang Lin
,
Qingmin Wang
,
Hao Niu
,
Guofu Zhai
Manufacturing process-based storage degradation modelling and reliability assessment.
Microelectron. Reliab.
(2018)
Xuerong Ye
,
Kaixin Zhang
,
Cen Chen
,
Zhongwei Li
,
Yue Wang
,
Guofu Zhai
The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress.
Microelectron. Reliab.
91 (2018)
Hao Niu
,
Shujuan Wang
,
Xuerong Ye
,
Huai Wang
,
Frede Blaabjerg
Lifetime prediction of aluminum electrolytic capacitors in LED drivers considering parameter shifts.
Microelectron. Reliab.
(2018)
Xuerong Ye
,
Cen Chen
,
Myeongsu Kang
,
Guofu Zhai
,
Michael G. Pecht
A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests.
IEEE Access
6 (2018)
Guofu Zhai
,
Yuege Zhou
,
Xuerong Ye
A Tolerance Design Method for Electronic Circuits Based on Performance Degradation.
Qual. Reliab. Eng. Int.
31 (4) (2015)
Xuerong Ye
,
Jie Deng
,
Qiong Yu
,
Guofu Zhai
Failure Process and Dynamic Reliability Estimation of Sealed Relay.
IEICE Trans. Electron.
(9) (2011)
Xuerong Ye
,
Huimin Liang
,
Jie Deng
,
Guofu Zhai
Research on Dynamic Characteristics Testing and Analyzing System of Electromagnetic Relay.
IEICE Trans. Electron.
(8) (2009)
Huimin Liang
,
Xuerong Ye
,
Guofu Zhai
Research on the Tolerance Distribution of Sealed Electromagnetic Relay with Reliability Index.
IEICE Trans. Electron.
(8) (2006)