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The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress.
Xuerong Ye
Kaixin Zhang
Cen Chen
Zhongwei Li
Yue Wang
Guofu Zhai
Published in:
Microelectron. Reliab. (2018)
Keyphrases
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computational model
probabilistic model
prior knowledge
parameter estimation
steady state
prediction model
real time
knowledge base
multiscale
objective function
motion estimation
theoretical analysis
statistical model
experimental data
neural network model