Login / Signup
A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests.
Xuerong Ye
Cen Chen
Myeongsu Kang
Guofu Zhai
Michael G. Pecht
Published in:
IEEE Access (2018)
Keyphrases
</>
joint distribution
probabilistic model
test data
maximum entropy
classification accuracy
generative model
parameter estimation