Xinggong Wan

Publication Activity (10 Years)

Years Active: 2014-2023
Publications (10 Years): 1

Top Topics

Simulation Study

Optimization Problems

Top Venues

Microelectron. Reliab.

Publications

Ri-an Zhao, Matthew Koskinen, Yang Liu, Xinggong Wan
Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET. IRPS (2023)
Xinggong Wan, Sandhya Chandrashekhar, Boris Bayha, Martin Trentzsch, Torben Balzer, Mahesh Siddabathula, Oliver Aubel
A quantitative study of Phosphorous implantation damage on the thick gate oxide of the 28 nm node. Microelectron. Reliab. 54 (9-10) (2014)