Voltage Ramp Stress Test Optimization for Wafer Level Hot Carrier Monitoring in FinFET.
Ri-an ZhaoMatthew KoskinenYang LiuXinggong WanPublished in: IRPS (2023)
Keyphrases
- power losses
- optimization problems
- levels of abstraction
- test data
- global optimization
- power system
- monitoring system
- real time
- optimization process
- optimization method
- electric field
- integrated circuit
- decision support
- constrained optimization
- optimization algorithm
- statistical significance
- evolutionary algorithm
- data sets