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X. L. Han
Publication Activity (10 Years)
Years Active: 2015-2024
Publications (10 Years): 2
Top Topics
Si Sio
Behavioral Model
Gate Dielectrics
Leakage Current
Top Venues
Microelectron. J.
ESSDERC
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Publications
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S. H. Meng
,
X. L. Han
,
P. Ding
,
B. Mei
,
Y. B. Su
,
J. L. Zhang
,
H. Q. Yun
,
Z. Jin
,
Yinghui Zhong
A behavioral model for electron irradiation effect on the DC performance in InP-based HEMT.
Microelectron. J.
148 (2024)
Guilhem Larrieu
,
Y. Guerfi
,
X. L. Han
,
N. Clement
Vertical field effect transistor with sub-15nm gate-all-around on Si nanowire array.
ESSDERC
(2015)