Woongje Sung

Publication Activity (10 Years)

Years Active: 2020-2023
Publications (10 Years): 8

Top Topics

Cmos Technology

High Temperature

Simulation Study

Top Venues

Publications

Dongyoung Kim, Skylar DeBoer, Stephen A. Mancini, Sundar Babu Isukapati, Justin Lynch, Nick Yun, Adam J. Morgan, Seung Yup Jang, Woongje Sung
Static, Dynamic, and Short-circuit Characteristics of Split-Gate 1.2 kV 4H-SiC MOSFETs. IRPS (2023)
Emran K. Ashik, Sundar Babu Isukapati, Hua Zhang, Tianshi Liu, Utsav Gupta, Adam J. Morgan, Veena Misra, Woongje Sung, Ayman A. Fayed, Anant K. Agarwal, Bongmook Lee
Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature CMOS Applications. IRPS (2022)
Hua Zhang, Tianshi Liu, Utsav Gupta, Sundar Babu Isukapati, Emran K. Ashik, Adam J. Morgan, Bongmook Lee, Woongje Sung, Anant K. Agarwal, Ayman A. Fayed
A 600V Half-Bridge Power Stage Fully Integrated with 25V Gate-Drivers in SiC CMOS Technology. MWSCAS (2022)
Stephen A. Mancini, Seung Yup Jang, Zeyu Chen, Dongyoung Kim, Justin Lynch, Yafei Liu, Balaji Raghothamachar, Minseok Kang, Anant Agarwal, Nadeemullah Mahadik, Robert Stahlbush, Michael Dudley, Woongje Sung
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures. IRPS (2022)
Robert Stahlbush, Nadeemullah A. Mahadik, Peter Bonanno, Jake Soto, Bruce Odekirk, Woongje Sung, Anant K. Agarwal
Defects in 4H-SiC epilayers affecting device yield and reliability. IRPS (2022)
Dongyoung Kim, Nick Yun, Woongje Sung
Advancing Static Performance and Ruggedness of 600 V SiC MOSFETs: Experimental Analysis and Simulation Study. IRPS (2021)
Tianshi Liu, Hua Zhang, Sundar Babu Isukapati, Emaran Ashik, Adam J. Morgan, Bongmook Lee, Woongje Sung, Marvin H. White, Ayman A. Fayed, Anant K. Agarwal
SPICE Modeling and CMOS Circuit Development of a SiC Power IC Technology. MWSCAS (2021)
Dongyoung Kim, Adam J. Morgan, Nick Yun, Woongje Sung, Anant Agarwal, Robert Kaplar
Non-Isothermal Simulations to Optimize SiC MOSFETs for Enhanced Short-Circuit Ruggedness. IRPS (2020)