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Woongje Sung
Publication Activity (10 Years)
Years Active: 2020-2023
Publications (10 Years): 8
Top Topics
Cmos Technology
High Temperature
Simulation Study
Sludge Compost
Top Venues
IRPS
MWSCAS
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Publications
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Dongyoung Kim
,
Skylar DeBoer
,
Stephen A. Mancini
,
Sundar Babu Isukapati
,
Justin Lynch
,
Nick Yun
,
Adam J. Morgan
,
Seung Yup Jang
,
Woongje Sung
Static, Dynamic, and Short-circuit Characteristics of Split-Gate 1.2 kV 4H-SiC MOSFETs.
IRPS
(2023)
Emran K. Ashik
,
Sundar Babu Isukapati
,
Hua Zhang
,
Tianshi Liu
,
Utsav Gupta
,
Adam J. Morgan
,
Veena Misra
,
Woongje Sung
,
Ayman A. Fayed
,
Anant K. Agarwal
,
Bongmook Lee
Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature CMOS Applications.
IRPS
(2022)
Hua Zhang
,
Tianshi Liu
,
Utsav Gupta
,
Sundar Babu Isukapati
,
Emran K. Ashik
,
Adam J. Morgan
,
Bongmook Lee
,
Woongje Sung
,
Anant K. Agarwal
,
Ayman A. Fayed
A 600V Half-Bridge Power Stage Fully Integrated with 25V Gate-Drivers in SiC CMOS Technology.
MWSCAS
(2022)
Stephen A. Mancini
,
Seung Yup Jang
,
Zeyu Chen
,
Dongyoung Kim
,
Justin Lynch
,
Yafei Liu
,
Balaji Raghothamachar
,
Minseok Kang
,
Anant Agarwal
,
Nadeemullah Mahadik
,
Robert Stahlbush
,
Michael Dudley
,
Woongje Sung
Static Performance and Reliability of 4H-SiC Diodes with P+ Regions Formed by Various Profiles and Temperatures.
IRPS
(2022)
Robert Stahlbush
,
Nadeemullah A. Mahadik
,
Peter Bonanno
,
Jake Soto
,
Bruce Odekirk
,
Woongje Sung
,
Anant K. Agarwal
Defects in 4H-SiC epilayers affecting device yield and reliability.
IRPS
(2022)
Dongyoung Kim
,
Nick Yun
,
Woongje Sung
Advancing Static Performance and Ruggedness of 600 V SiC MOSFETs: Experimental Analysis and Simulation Study.
IRPS
(2021)
Tianshi Liu
,
Hua Zhang
,
Sundar Babu Isukapati
,
Emaran Ashik
,
Adam J. Morgan
,
Bongmook Lee
,
Woongje Sung
,
Marvin H. White
,
Ayman A. Fayed
,
Anant K. Agarwal
SPICE Modeling and CMOS Circuit Development of a SiC Power IC Technology.
MWSCAS
(2021)
Dongyoung Kim
,
Adam J. Morgan
,
Nick Yun
,
Woongje Sung
,
Anant Agarwal
,
Robert Kaplar
Non-Isothermal Simulations to Optimize SiC MOSFETs for Enhanced Short-Circuit Ruggedness.
IRPS
(2020)