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Defects in 4H-SiC epilayers affecting device yield and reliability.
Robert Stahlbush
Nadeemullah A. Mahadik
Peter Bonanno
Jake Soto
Bruce Odekirk
Woongje Sung
Anant K. Agarwal
Published in:
IRPS (2022)
Keyphrases
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machine learning
defect classification
databases
software reliability
real time
computer vision
multiscale
expert systems
eye tracking
failure rate
printed circuit boards
highly reliable
reliability analysis
force feedback
wearable devices