Bias Temperature Instability on SiC n- and p-MOSFETs for High Temperature CMOS Applications.
Emran K. AshikSundar Babu IsukapatiHua ZhangTianshi LiuUtsav GuptaAdam J. MorganVeena MisraWoongje SungAyman A. FayedAnant K. AgarwalBongmook LeePublished in: IRPS (2022)