Thomas S. Barnett

Publication Activity (10 Years)

Years Active: 2001-2006
Publications (10 Years): 0

Publications

Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh
Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. IEEE Des. Test Comput. 23 (2) (2006)
Thomas S. Barnett, Adit D. Singh
Relating Yield Models to Burn-In Fall-Out in Time. ITC (2003)
Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
Extending integrated-circuit yield-models to estimate early-life reliability. IEEE Trans. Reliab. 52 (3) (2003)
Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy
Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. VTS (2002)
Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh
Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. ITC (2002)
Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
Estimating burn-in fall-out for redundant memory. ITC (2001)
Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model. VTS (2001)
Thomas S. Barnett, Adit D. Singh, Victor P. Nelson
Yield-Reliability Modeling for Fault Tolerant Integrated Circuits. DFT (2001)