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Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction.

Thomas S. BarnettMatt GradyKathleen G. PurdyAdit D. Singh
Published in: IEEE Des. Test Comput. (2006)
Keyphrases
  • negative binomial
  • contingency tables
  • log normal
  • hierarchical model
  • multiscale
  • probability distribution
  • random variables
  • joint distribution