Kathleen G. Purdy

Publication Activity (10 Years)

Years Active: 2002-2006
Publications (10 Years): 0

Publications

Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh
Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. IEEE Des. Test Comput. 23 (2) (2006)
Thomas S. Barnett, Adit D. Singh, Matt Grady, Kathleen G. Purdy
Yield-Reliability Modeling: Experimental Verification and Application to Burn-In Reduction. VTS (2002)
Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh
Redundancy Implications for Early-Life Reliability: Experimental Verification of an Integrated Yield-Reliability Model. ITC (2002)