Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability Model.

Thomas S. Barnett Adit D. Singh Victor P. Nelson

Published in: VTS (2001)

Keyphrases

mathematical model
formal model
probabilistic model
computational model
process model
simulation model
bayesian framework
sensitivity analysis
conceptual model
experimental data
statistical model
data sets
theoretical framework
cost function
objective function
genetic algorithm
data mining