Login / Signup

Yield-Reliability Modeling for Fault Tolerant Integrated Circuits.

Thomas S. BarnettAdit D. SinghVictor P. Nelson
Published in: DFT (2001)
Keyphrases
  • fault tolerant
  • integrated circuit
  • fault tolerance
  • distributed systems
  • load balancing
  • state machine
  • high availability
  • printed circuit boards
  • high assurance
  • interconnection networks
  • mobile agent system