Shou-Chung Lee

Publication Activity (10 Years)

Years Active: 2006-2018
Publications (10 Years): 2

Top Topics

Statistical Modeling

Chemical Vapor Deposition

Electrical Properties

Top Venues

Publications

Yi Ching Ong, Shou-Chung Lee, A. S. Oates
Percolation defect nucleation and growth as a description of the statistics of electrical breakdown for gate, MOL and BEOL dielectrics. IRPS (2018)
Pin-Shiang Chen, Shou-Chung Lee, A. S. Oates, Chee Wee Liu
BEOL TDDB reliability modeling and lifetime prediction using critical energy to breakdown. IRPS (2018)
Shou-Chung Lee, A. S. Oates
On the voltage dependence of copper/low-k dielectric breakdown. IRPS (2015)
A. S. Oates, Shou-Chung Lee
Electromigration failure distributions of dual damascene Cu /low - k interconnects. Microelectron. Reliab. 46 (9-11) (2006)