Rainer Dorsch

Publication Activity (10 Years)

Years Active: 1998-2024
Publications (10 Years): 11

Top Topics

Evaluation Method

Energy Efficient

Top Venues

Publications

Alexandra Küster, Rainer Dorsch, Christian Haubelt
Adaptive ODE Solvers for Timed Data Flow Models in SystemC-AMS. DATE (2024)
Alexandra Küster, Rainer Dorsch, Christian Haubelt
Structural Generation of Virtual Prototypes for Smart Sensor Development in SystemC-AMS from Simulink Models. DATE (2023)
Alexandra Küster, Rainer Dorsch, Christian Haubelt, Karsten Einwich
Virtual Prototyping in SystemC AMS for Validation of Tight Sensor/Firmware Interaction in Smart Sensors. FDL (2022)
Jens Rudolf, Daniel Gis, Sebastian Stieber, Christian Haubelt, Rainer Dorsch
SystemC Power Profiling for IoT Device Firmware using Runtime Configurable Models. MECO (2019)
Florian Grützmacher, Albert Hein, Benjamin Beichler, Polichronis Lepidis, Rainer Dorsch, Thomas Kirste, Christian Haubelt
Energy Efficient On-Sensor Processing for Online Activity Recognition. PECCS (2018)
Sebastian Stieber, Rainer Dorsch, Christian Haubelt
Accurate Sample Time Reconstruction of Inertial FIFO Data. Sensors 17 (12) (2017)
Florian Grützmacher, Johann-Peter Wolff, Albert Hein, Polichronis Lepidis, Rainer Dorsch, Thomas Kirste, Christian Haubelt
Towards energy efficient sensor nodes for online activity recognition. IECON (2017)
Johann-Peter Wolff, Sebastian Stieber, Tobias Rankl, Rainer Dorsch
Improving Always-On Gesture Recognition Power Efficiency for Android Devices Using Sensor Hubs. CSE/EUC/DCABES (2016)
Sebastian Stieber, Rainer Dorsch, Christian Haubelt
Accurate Sample Time Reconstruction for Sensor Data Synchronization. ARCS (2016)
Nils Büscher, Lars Middendorf, Christian Haubelt, Rainer Dorsch, Frederik Wegelin
Statistical analysis and improvement of the repeatability and reproducibility of an evaluation method for IMUs on a smartphone. EICS (2016)
Lars Middendorf, Rainer Dorsch, Rudolf Bichler, Christina Strohrmann, Christian Haubelt
A Mobile Camera-Based Evaluation Method of Inertial Measurement Units on Smartphones. IoT 360 (2) (2015)
Sebastian Stieber, Johann-Peter Wolff, Christian Haubelt, Rainer Dorsch
Hybride Prototypisierung eines Sensorsubsystems. MBMV (2014)
Rainer Dorsch, Richard K. Errickson, Markus M. Helms, G. Crew, Thomas A. Gregg, Welela Haileselassie, L. W. Helmer, Andreas Kohler, Kulwant M. Pandey, Susanne Roscher, E. S. Rotter, Christian Haubelt
IBM Parallel Sysplex design for the IBM z196 system. IBM J. Res. Dev. 56 (1) (2012)
Anton Tsepurov, Gunter Bartsch, Rainer Dorsch, Maksim Jenihhin, Jaan Raik, Valentin Tihhomirov
A scalable model based RTL framework zamiaCAD for static analysis. VLSI-SoC (2012)
Joachim Falk, Christian Zebelein, Christian Haubelt, Jürgen Teich, Rainer Dorsch
Integrating Hardware/Firmware Verification Efforts Using SystemC High-Level Models. MBMV (2010)
Christian Zebelein, Joachim Falk, Christian Haubelt, Jürgen Teich, Rainer Dorsch
Efficient High-Level modeling in the networking domain. DATE (2010)
Thomas Schlipf, Markus M. Helms, Jürgen Ruf, M. Klein, Rainer Dorsch, B. Hoppe, Walter Lipponer, S. Boekholt, T. Rower, Manfred H. Walz, S. Junghans
Design and verification of the IBM System z10 I/O subsystem chips. IBM J. Res. Dev. 53 (1) (2009)
Rainer Dorsch, Jürgen Ruf
Transaction Modeling and RTL Simulation Analysis. MBMV (2007)
Martin Streubühr, Joachim Falk, Christian Haubelt, Jürgen Teich, Rainer Dorsch, Thomas Schlipf
Task-accurate performance modeling in SystemC for real-time multi-processor architectures. DATE (2006)
Pattara Kiatisevi, Luis Leonardo Azuara-Gomez, Rainer Dorsch, Hans-Joachim Wunderlich
Development of an audio player as system-on-a-chip using an open source platform. ISCAS (3) (2005)
Lars Schäfer, Rainer Dorsch, Hans-Joachim Wunderlich
RESPIN++ - deterministic embedded test. ETW (2002)
Rainer Dorsch, Hans-Joachim Wunderlich
Reusing Scan Chains for Test Pattern Decompression. J. Electron. Test. 18 (2) (2002)
Rainer Dorsch, Ramón Huerta Rivera, Hans-Joachim Wunderlich, Martin Fischer
Adapting an SoC to ATE Concurrent Test Capabilities. ITC (2002)
Rainer Dorsch, Hans-Joachim Wunderlich
Reusing scan chains for test pattern decompression. ETW (2001)
Rainer Dorsch, Hans-Joachim Wunderlich
Tailoring ATPG for embedded testing. ITC (2001)
Rainer Dorsch, Hans-Joachim Wunderlich
Using mission logic for embedded testing. DATE (2001)
Rainer Dorsch, Hans-Joachim Wunderlich
Accumulator based deterministic BIST. ITC (1998)